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Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements

机译：通过棱镜-膜耦合测量确定薄膜的折射率，厚度和光学损耗

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International audience

机译：国际观众

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作者
Cardin, Julien; Leduc, Dominique;
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年度 2008
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正文语种 en
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1. Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements [J] . Cardin J, Leduc D Applied optics . 2008,第7期

机译：通过棱镜-膜耦合测量确定薄膜的折射率，厚度和光学损耗
2. Refractive index measurements of films with biaxial symmetry. 2. Determination of film thickness and refractive indices using polarized transmission spectra in the transparent wavelength range [J] . Diao J, Hess DW The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical . 2005,第26期

机译：具有双轴对称性的薄膜的折射率测量。 2.使用透明波长范围内的偏振透射光谱确定膜的厚度和折射率
3. Refractive index measurements of films with biaxial symmetry. 2. Determination of film thickness and refractive indices using polarized transmission spectra in the transparent wavelength range [J] . Diao J, Hess DW The journal of physical chemistry, B. Condensed matter, materials, surfaces, interfaces & biophysical . 2005,第26期

机译：具有双轴对称性的薄膜的折射率测量。 2.使用透明波长范围内的偏振透射光谱确定膜的厚度和折射率
4. Heterodyne interferometer for film thickness and refractive index measurements of optical thin film [C] . Nobuhiro Shimizu, Shibaura Institute of Technology, Tokyo, International Symposium on Polarization Analysis and Applications to Device Technology . 1996

机译：外差式干涉仪，用于测量光学薄膜的厚度和折射率
5. Determination of carbon nanotube thin film thickness and optical parameters by a new modified prism waveguide coupler system [D] . Baltas, Georgios 2013

机译：新型改进的棱镜波导耦合器系统测定碳纳米管薄膜的厚度和光学参数
6. Treasure of the Past VII: Measurement of the Thickness and Refractive Index of Very Thin Films and the Optical Properties of Surfaces by Ellipsometry [O] . Frank L. McCrackin, Elio Passaglia, Robert R. Stromberg, 2001

机译：过去的宝藏VII：通过椭偏仪测量非常薄膜的厚度和折射率以及表面的光学性质
7. Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements [O] . Cardin, Julien, Leduc, Dominique 2008

机译：通过棱镜-膜耦合测量确定薄膜的折射率，厚度和光学损耗
8. Simultaneous Determination of Refractive Index and Thickness of Very Thin Films by Ellipsometry [R] . Rai, R. 1967

机译：椭偏法同时测定极薄膜的折射率和厚度

Determination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements

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